Characterization and Testing

We offer the following materials and device testing or characterization services:

• Spectral and luminescence emission measurements of phosphors, lamps, LEDs, and displays (UV/Vis/IR).  UVC lamp evaluation service. NEW!
• Calibrated luminous, quantum, and power efficiency/efficacy testing of luminescent materials and devices using integrating spheres
• Measurement of Color Chromaticity Coordinates (CIE), Correlated Color Temperature (CCT), Color Rendering Index (CRI), and other photo metrics – or you can do the measurement yourself using this compact and portable optical spectroscopy instrument
• Measurement of optical and electrical properties of photovoltaic devices and structures using various light sources, including a solar simulator
• Particle size distribution measurement of nano particles and bulk powders from 0.1 nanometers to over 800 microns
• Imaging using Scanning Electron Microscope (SEM) and optical microscopes
• Imaging using near-infrared (NIR), short-wave infrared (SWIR), Mid-wave infrared (MWIR), and Long-wave infrared (LWIR).
• X-ray characterization of scintillators and radiological imaging of mechanical and electronic components
• Elemental analysis and chemical characterization by Energy-dispersive X-ray spectroscopy (EDS or EDX)
• Infrared analysis by Fourier Transform Infrared Spectroscopy (FTIR) of gases, liquids, and solids
• UV-Vis-IR absorption, reflectance, and transmission measurements of solutions, solids, powders, and thin-films. Spectral capabilities range from excimer VUV/UVC up to Short-wave IR (SWIR).
• Multi-laser Raman spectroscopy of solutions, solids, powders, and thin-films
• Thickness and refractive index measurement of thin-films and multi-layer structures