Characterization and Testing

We offer the following materials/device testing and characterization services:

  • Spectral and luminescence emission measurements of phosphors, lamps, LEDs, and displays (UV, Visible, and Infrared)
  • Calibrated luminous, quantum, and power efficiency/efficacy testing of luminescent materials and devices using integrating spheres
  • Measurement of Color Chromaticity Coordinates (CIE), Correlated Color Temperature (CCT), Color Rendering Index (CRI), and other photo metrics
  • Measurement of optical and electrical properties of photovoltaic devices and structures using various light sources, including a solar simulator
  • Particle size distribution measurement of nano particles and bulk powders from 0.1 nanometers to over 800 microns
  • Imaging using Scanning Electron Microscope (SEM) and optical microscopes
  • X-ray characterization of scintillators and radiological imaging of mechanical and electronic components
  • Elemental analysis and chemical characterization by Energy-dispersive X-ray spectroscopy (EDS or EDX)
  • Infrared analysis by Fourier Transform Infrared Spectroscopy (FTIR) of gases, liquids, and solids
  • UV-Vis-IR absorption, reflectance, and transmission measurements of solutions, solids, powders, and thin-films
  • Thickness and refractive index measurement of thin-films and multi-layer structures